The most common solution for WAT test: Prober + Hinge + WAT Tester
The above picture shows, from left to right, the working state, intermediate flip state and service state respectively.
The Hinge rotating shaft flips together with the holding arm system and the tester. The component with a matching pneumatic limit lock at the distal end of the arm‑holding structure, and a card holder for tester positioning and position sensing is located in the middle.
KATAN can offer: Hinge (with pneumatic limit assembly) + Holding Arm system + card holder
Semiconductor Testing ‑ Wafer Acceptance...